| Brand Name: | rmi |
| Model Number: | X-7900Ultra |
| MOQ: | 1 pcs |
| Price: | 173200 USD |
| Packaging Details: | Wodden box |
| Payment Terms: | T/T |
The RMI 3DiCT X-7900 Ultra Nano-Focus X-Ray Inspection System is an industrial X-ray inspection machine built to examine the internal structure of electronic components, solder joints, and printed circuit boards (PCBs) without damaging the samples.
It is especially suited to electronics manufacturing, SMT production lines, semiconductor inspection, and quality-control laboratories.
| Category | Specification | X-7900 Ultra |
|---|---|---|
| Tube | Model | X-7900 Ultra |
| Tube type | Open tube | |
| Target power | 15 W / Diamond Target | |
| Spatial resolution | 1 μm | |
| Tube voltage | 160 kV | |
| FPD | Image taking type | Flat-panel Digital |
| Imaging precision | 49.8 μm | |
| A/D convert quantified density value | 16 bit (65536) | |
| Dpi | 2340 * 2882 px | |
| Frame frequency | 9 FPS | |
| Tube current | 500 μA | |
| System | Optical magnification | 2000X |
| System magnification | 7500X | |
| Operating system | Windows 11 | |
| Power supply | AC 110–220 V, 50–60 Hz | |
| Power | 1200 W | |
| Radiation safety test | <1 μSv/h | |
| Structure | FPD tilt angle | ±70° |
| Stage size | 670 mm * 670 mm | |
| Sensing range | 600 mm * 600 mm | |
| Load-bearing | ≤10 kg | |
| Machine size | 1578 * 1675 * 2265 mm (L * W * H) | |
| Machine weight | 2200 kg | |
| Stage movement | Automatic / manual | |
| CT | Planar CL | CL sampling diameter: 530 mm |
| Cone beam CT | CT sampling diameter: 60 mm | |
| Inspection area size | Planar CT 300 * 300 mm; Cone beam CT 60 * 240 mm | |
| CT accuracy | 1 μm, 5 μm, 15 μm, 100 μm | |
| Min. imaging time (tomography) | 18 s | |
| Min. reconstruction time | 30 s | |
| Safety | CE Certificate | Yes: STE23113101S |
| Radiation Safety Permit | Yes |
| Function | What It Does |
|---|---|
| Array function | Automatically inspects multiple samples at predefined positions and spacing. |
| Void measurement | Measures void size, void ratio, and solder climbing height. |
| Visual navigation | Helps operators locate specific inspection areas accurately. |
| High-resolution X-ray imaging | Produces detailed images of internal structures. |
| Tilted observation | Supports observation at angles up to ±70°, according to the supplied specifications. |
| 360° rotating stage | Allows samples to be rotated for inspection from different directions. |
| AI measurement | Optional automatic defect measurement and analysis. |
| Dual CT system | Optional 3D inspection using the specified CT configurations. |
| Brand Name: | rmi |
| Model Number: | X-7900Ultra |
| MOQ: | 1 pcs |
| Price: | 173200 USD |
| Packaging Details: | Wodden box |
| Payment Terms: | T/T |
The RMI 3DiCT X-7900 Ultra Nano-Focus X-Ray Inspection System is an industrial X-ray inspection machine built to examine the internal structure of electronic components, solder joints, and printed circuit boards (PCBs) without damaging the samples.
It is especially suited to electronics manufacturing, SMT production lines, semiconductor inspection, and quality-control laboratories.
| Category | Specification | X-7900 Ultra |
|---|---|---|
| Tube | Model | X-7900 Ultra |
| Tube type | Open tube | |
| Target power | 15 W / Diamond Target | |
| Spatial resolution | 1 μm | |
| Tube voltage | 160 kV | |
| FPD | Image taking type | Flat-panel Digital |
| Imaging precision | 49.8 μm | |
| A/D convert quantified density value | 16 bit (65536) | |
| Dpi | 2340 * 2882 px | |
| Frame frequency | 9 FPS | |
| Tube current | 500 μA | |
| System | Optical magnification | 2000X |
| System magnification | 7500X | |
| Operating system | Windows 11 | |
| Power supply | AC 110–220 V, 50–60 Hz | |
| Power | 1200 W | |
| Radiation safety test | <1 μSv/h | |
| Structure | FPD tilt angle | ±70° |
| Stage size | 670 mm * 670 mm | |
| Sensing range | 600 mm * 600 mm | |
| Load-bearing | ≤10 kg | |
| Machine size | 1578 * 1675 * 2265 mm (L * W * H) | |
| Machine weight | 2200 kg | |
| Stage movement | Automatic / manual | |
| CT | Planar CL | CL sampling diameter: 530 mm |
| Cone beam CT | CT sampling diameter: 60 mm | |
| Inspection area size | Planar CT 300 * 300 mm; Cone beam CT 60 * 240 mm | |
| CT accuracy | 1 μm, 5 μm, 15 μm, 100 μm | |
| Min. imaging time (tomography) | 18 s | |
| Min. reconstruction time | 30 s | |
| Safety | CE Certificate | Yes: STE23113101S |
| Radiation Safety Permit | Yes |
| Function | What It Does |
|---|---|
| Array function | Automatically inspects multiple samples at predefined positions and spacing. |
| Void measurement | Measures void size, void ratio, and solder climbing height. |
| Visual navigation | Helps operators locate specific inspection areas accurately. |
| High-resolution X-ray imaging | Produces detailed images of internal structures. |
| Tilted observation | Supports observation at angles up to ±70°, according to the supplied specifications. |
| 360° rotating stage | Allows samples to be rotated for inspection from different directions. |
| AI measurement | Optional automatic defect measurement and analysis. |
| Dual CT system | Optional 3D inspection using the specified CT configurations. |